Over the past decade, demand for nano-electrical characterization has rapidly increased due to the continuous miniaturization of electronic devices. The semiconductor and microelectronics industries ...
Capacitance-voltage (C-V) testing is widely used to determine semiconductor parameters, particularly in MOSCAP and MOSFET structures. However, other types of semiconductor devices and technologies ...
Strongly correlated. Two graphene sheets stacked on each other with a twist make a long-wavelength moiré pattern. Credit: Designed by Kai Fu for Yazdani Lab, Princeton University The energy states ...
Norwood, Mass. — Analog Devices, Inc.'s new families of capacitance-to-digital converters (CDCs) and impedance-to-digital converters (IDCs) simplify instrumentation and sensor design in industrial, ...
In logic devices such as finFETs (field-effect transistors), metal gate parasitic capacitance can negatively impact electrical performance. One way to reduce this parasitic capacitance is to optimize ...
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