Semiconductor Engineering

Using Test And Metrology Data For Dynamic Process Control

Advanced packaging is transforming semiconductor manufacturing into a multi-dimensional challenge, blending 2D front-end wafer fabrication with 2.5D/3D assemblies, high-frequency device ...
National Academies of Sciences%2c Engineering%2c and Medicine

Statistics, Testing, and Defense Acquisition: New Approaches and Methodological Improvements

Suggested Citation: "1 Introduction." National Research Council. 1998. Statistics, Testing, and Defense Acquisition: New Approaches and Methodological Improvements ...
Medicine Buffalo

Statistical Process Control (SPC)

This asynchronous course addresses the basic theory behind Statistical Process Control (SPC), a method used in monitoring and controlling the quality of a process through statistical analysis to ...
PharmiWeb

Statistical Process Control (SPC) Training: An Exercise-Based Course - Key Methodology Used in Quality Management to Monitor, Control, and Improve Process Performance (February ...

DUBLIN--(BUSINESS WIRE)--The "Statistical Process Control (SPC): An Exercise-Based Training Course (February 6, 2026)" training has been added to ResearchAndMarkets.com's offering. This course ...